ADB673 - FORENSIC MICROSCOPY
| Course Name | Code | Semester | Theory (hours/week) |
Application (hours/week) |
Credit | ECTS |
|---|---|---|---|---|---|---|
| FORENSIC MICROSCOPY | ADB673 | Any Semester/Year | 3 | 0 | 3 | 8 |
| Prequisites | ||||||
| Course language | Turkish | |||||
| Course type | Elective | |||||
| Mode of Delivery | Face-to-Face | |||||
| Learning and teaching strategies | Lecture Discussion Question and Answer Observation Drill and Practice | |||||
| Instructor (s) | Prof. Dr. Erkan AYDAR, Assoc. Prof. H. Evren ÇUBUKÇU | |||||
| Course objective | Microscopy is the technique whice uses microscope for the examination and the identification of objects which can not be seen with unaided eye. It is mainly branched into 3 categories according to working principles: Optical, Electron and Probe Microscopy. Optical Microscopy uses visible light, whereas Electron microscopy uses a focused electron beam. On the other hand, in Probe microscopy a physical probe scans the object thus forming the image. Microscopy techniques are essential on evaluating forensic trace evidence. The determination of minute details which can not be distingu,shed w,th a naked human eye has a significant role on forensic cases. In the frame of this course, basic microscopy techniques, undamaged examination of forensic evidence, obtainable results and their evaluation will be given practically. | |||||
| Learning outcomes |
| |||||
| Course Content | Introduction to light, electron and probe microscopy techniques for evaluation of forensic evidences. Sample preparation and suitable samples for light microscopy techniques, obtainable data. Sample preparation and suitable samples for electron microscopy techniques, obtainable data. Sampling, determination and identification of Gunshot Residues (GSR), firearms, paint pigments, fibres, handwriting, counterfeiting, comprasion of trace evidence and high resolution surface inspection using Electron Microscope equipped with an Energy Dispersive Spectrometer (EDS). Practical applications on various samples: preparation and inspection | |||||
| References | 1. Scanning Electron Microscopy and X-ray Microanalysis Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael, Springer, 2003 | |||||
Course outline weekly
| Weeks | Topics |
|---|---|
| Week 1 | Microscopy: Definition and History |
| Week 2 | Microscopy Methods: Opical, Electron and Probe |
| Week 3 | Microscopes and the objects that they can analyze |
| Week 4 | Optical Microscopy and Optical Microscopes |
| Week 5 | Forensic Evidence Comparison under Optical Microscope: Handwriting, counterfeiting, forgery, textile characterization, biological samples) |
| Week 6 | Principles of Electron Microscopy |
| Week 7 | Scanning Electron Microscope (SEM) and Energy Dispersive Spectrometer (EDS) |
| Week 8 | Examination of forensic evidence with SEM-EDS-1: Sample preparation, biological, chemical and geological material) |
| Week 9 | Examination of forensic evidence with SEM-EDS-2: Gunshot Resdues, identification of firearm from groove marks, counterfeiting, pigment analysis, fabric comparison, narcotics |
| Week 10 | Mid-Term |
| Week 11 | Principles of Probe Microscopy |
| Week 12 | Examination of forensic evidence with Probe Microscopy |
| Week 13 | Semester performance evaluation |
| Week 14 | Semester performance evaluation |
| Week 15 | Preportion for final exam |
| Week 16 | Final exam |
Assesment methods
| Course activities | Number | Percentage |
|---|---|---|
| Attendance | 0 | 0 |
| Laboratory | 0 | 0 |
| Application | 0 | 0 |
| Field activities | 0 | 0 |
| Specific practical training | 0 | 0 |
| Assignments | 0 | 0 |
| Presentation | 1 | 20 |
| Project | 0 | 0 |
| Seminar | 0 | 0 |
| Midterms | 1 | 30 |
| Final exam | 1 | 50 |
| Total | 100 | |
| Percentage of semester activities contributing grade succes | 0 | 50 |
| Percentage of final exam contributing grade succes | 0 | 50 |
| Total | 100 | |
WORKLOAD AND ECTS CALCULATION
| Activities | Number | Duration (hour) | Total Work Load |
|---|---|---|---|
| Course Duration (x14) | 14 | 3 | 42 |
| Laboratory | 0 | 0 | 0 |
| Application | 0 | 0 | 0 |
| Specific practical training | 0 | 0 | 0 |
| Field activities | 0 | 0 | 0 |
| Study Hours Out of Class (Preliminary work, reinforcement, ect) | 14 | 10 | 140 |
| Presentation / Seminar Preparation | 1 | 20 | 20 |
| Project | 0 | 0 | 0 |
| Homework assignment | 0 | 0 | 0 |
| Midterms (Study duration) | 1 | 15 | 15 |
| Final Exam (Study duration) | 1 | 20 | 20 |
| Total Workload | 31 | 68 | 237 |
Matrix Of The Course Learning Outcomes Versus Program Outcomes
| D.9. Key Learning Outcomes | Contrubition level* | ||||
|---|---|---|---|---|---|
| 1 | 2 | 3 | 4 | 5 | |
| 1. Improves knowledge in proficiency level based on the undergraduate level in biology or different disciplines and analyses by using the statistic methods and interprets them. | X | ||||
| 2. Uses theoretical and practical knowledge obtained from his/her field in proficiency level | X | ||||
| 3. Interprets the knowledge that obtained from his/her field with integrating the acquired knowledge from the other disciplines and comprises new knowledge. | X | ||||
| 4. Sorts out the encountered problems on his/her field by using the investigation methods. | X | ||||
| 5. Conducts a study which requires specialization in his/her field independently | X | ||||
| 6. Improves new strategies to solve encountered and unpredictable complex problems in his/her field by taking responsibility | X | ||||
| 7. Evaluates the proficiency level knowledge and skills in his/her field in a critical approach and processes his/her learning. | X | ||||
| 8. Uses informatics and communication technologies with the computer software required in his/her field | X | ||||
| 9. Has the ability of minding social, scientific, cultural and ethical values in the levels of collecting, interpreting, applying and announcing the data in his/her field. | X | ||||
| 10. Evaluates the important people, events and cases by minding the results, which take in part in the improvement of his/her field. | X | ||||
*1 Lowest, 2 Low, 3 Average, 4 High, 5 Highest